活動消息

Here are some news on products, background information (papers) and exhibitions for the first half of 2013.

News of the Klippel QC System                                                                                                                   

New PRODUCTION ANALYZER HARDWARE VERSION                                                                                

A new hardware version of the Production Analyzer has been released:

The fire-wire interface is replaced by an USB2.0 interface, simplifying the cabling to one USB connection only, avoiding problems of new computers without fire-wire interface and ensuring Windows 8 compatibility.
The new version is called "Production Analyzer USBonly". All new orders include the new version.

Please contact  support@klippel.de  for details.

 

Add-on to Application Note 46                                                                                                                     

There is a new add-on to AN 46 - Test Enclosure for QC:

A simple excel sheet is provided to calculate the maximal sound pressure level in a test enclosure.

 

we are looking for Beta Test User                                                                                                               

Beta test users for new products are welcome:

Automatic Defect Classification / Root cause analysis

The Automatic Defect Classification (ADC) is an advanced statistical tool for root cause analysis and classification of Klippel testing data.
An advanced algorithm analyzes large amounts of data to find similar characteristics resulting in separate, objective classes. The accumulated statistical knowledge may be applied by the Klippel QC System for automatic on-line classification of test objects, directly on the production line. In addition to the conventional Pass/Fail verdict the resulting fuzzy classification offers unique benefits like fast defect root cause diagnostics without human interaction and immediate feedback to the production process.

To join the beta test programor for more information, please contact  Robert Werner

 

Differential Auralization

The differential auralization is based on a new decomposition technique of recorded wave files (e.g. results from QC tests). It provides many applications such as auralization of defects (Rubb&Buzz). For more details, see the paper by M. Liebig below.
To join the beta test program or for more information, please contact Marian Liebig

 

New Papers                                                                                                                                                    

 

 

Preview on Events                                                                                                                                       

 

Prolight & Sound Frankfurt (10^th -13^th April 2013)

Come and visit our booth J13 in Hall 8.0 (Audio and Sound Systems). For meetings with our engineers please contact Stefanie.

134th AES Convention ROME (4^th- 7^th May 2013) 

Wolfgang Klippel will present a tutorial on “Hot- and Nonlinear Loudspeakers at high amplitudes”. He will also present the Richard C. Heyser Memorial Lecture entitled “Small Loud-Speakers – Taking Physics to the Limit”.

         Klippel seminar in reggio-emilia / italy (13^th -14^th may 2013)

 A 2-day Seminar on “Sound Quality of Audio Systems” will be held by Wolfgang Klippel shortly after the AES in Rome. RCF Audio Academy are generously sponsoring the seminar which is free of charge.

                                For further information and registration please click here.